Fault Testing and Diagnosis Techniques for Carbon Nanotube-Based FPGAs
Author:
Affiliation:
1. School of Electronic and Information Engineering, Beihang University,Beijing,China,100191
2. School of Integrated Circuit Science and Technology, Beihang University,Beijing,China,100191
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9712466/9712479/09712558.pdf?arnumber=9712558
Reference15 articles.
1. Separation of Metallic from Semiconducting Single-Walled Carbon Nanotubes
2. A XOR-tree based technique for constant testability of configurable FPGAs
3. Fault Detection and Fault Diagnosis Techniques for Lookup Table FPGAs
4. Compact Model for Carbon Nanotube Field-Effect Transistors Including Nonidealities and Calibrated With Experimental Data Down to 9-nm Gate Length
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