Characterization Measurements of Sapphire and Diamond based KIDs for Polarimetric Plasma Diagnostics-Reference-Cited by-同舟云学术

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Characterization Measurements of Sapphire and Diamond based KIDs for Polarimetric Plasma Diagnostics

Published:2022-08-28 Issue: Volume: Page:
ISSN:
Container-title:2022 47th International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz)
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Author:

Mazzocchi F.¹,Ilin K.²,Kempf S.²,Kuzmin A.³,Straus D.¹,Scherer T.¹

Affiliation:

1. Institute of Applied Materials – Applied Materials Physics, Karlsruhe Institute of Technology (KIT IAM-AWP)

2. Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT – IMS)

3. Karlsruhe Institute of Technology (KIT - LAS),Laboratory for Applications of Synchrotron Radiation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9895463/9895465/09895947.pdf?arnumber=9895947

Reference13 articles.

1. Dielectric properties of single crystalline diamond wafers with large area at microwave wavelengths

2. Lumped Element Kinetic Inductance Detectors

3. Polarization measurement techniques suitable for ITER poloidal polarimeter;imazawa;In Proceedings of the 41st Plasma Physics Conference on Plasma Physics (EPS2014),0

4. Kinetic Inductance Detectors for X-Ray Spectroscopy

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