Substrate Bias Effect Linked to Parasitic Series Resistance in Multiple-Gate SOI MOSFETs-Reference-Cited by-同舟云学术

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Substrate Bias Effect Linked to Parasitic Series Resistance in Multiple-Gate SOI MOSFETs

Published:2007-09 Issue:9 Volume:28 Page:834-836
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Rudenko T..,Kilchytska V..,Collaert N..,Jurczak M..,Nazarov A..,Flandre D..

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/4294048/04294069.pdf?arnumber=4294069

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