Hysteretic critical intergrain transport current in superconducting YBa/sub 2/Cu/sub 3/O/sub 7/ as a basis for new switching and data storage effects
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx1/20/3657/00133400.pdf?arnumber=133400
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Examination of the peak in dICO/dlntin weak-linked highTcsuperconductors caused by trapped flux;Superconductor Science and Technology;2007-02-26
2. Ic hysteresis in polycrystalline high Tc superconductors;Physica C: Superconductivity;2004-03
3. Flux-trapping phenomena in sintered tubes of high-Tcsuperconductors;Physical Review B;1994-06-01
4. A model for the hysteretic critical current density in polycrystalline high-temperature superconductors;Physica C: Superconductivity;1993-02
5. Hysteretic time dependence of the critical intergrain transport current in sintered YBa2Cu3O7;Physica C: Superconductivity;1992-11
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