Author:
Balasubramanian A.,Sternberg A. L.,Bhuva B. L.,Massengill L. W.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
21 articles.
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2. Thermal Noise;Noise Contamination in Nanoscale VLSI Circuits;2022
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4. Mutual interference induced by single event effects in CMOS circuits;AIP Advances;2020-06-01
5. Buffer for High Performance in CNT Based VLSI Interconnects;Advanced Science Letters;2018-08-01