Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
10 articles.
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1. Defect-Oriented Testing of RF Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2008-05
2. Understanding yield losses in logic circuits;IEEE Design and Test of Computers;2004-05
3. Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement;Microelectronics Reliability;2001-12
4. Fault characterization and testability considerations in multi-valued logic circuits;Proceedings 1999 29th IEEE International Symposium on Multiple-Valued Logic (Cat. No.99CB36329)
5. Defect-oriented fault simulation and test generation in digital circuits;Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design