DDR5 Electrical Challenges in High-Speed Server Design

Author:

Winterberg Douglas1,Kumar Vijender2,Chen Tom3,Mutnury Bhyrav1

Affiliation:

1. Dell Technologies Server Group,Round Rock,TX,USA

2. Dell Technologies Server Group,Bangalore,India

3. Dell Technologies Server Group,Taipei,Taiwan

Publisher

IEEE

Reference8 articles.

1. Signal Integrity Characterization of Via Stubs on High Speed DDR4 Channels;dannan;DesignCon,2020

2. Equation-Based Solutions to Coupled, Asymmetrical, Lossy, and Nonuniform Microstrip Lines for Tab-Routing Applications

3. DDR5 Design Challenges;bhagwath;IEEE Workshop on Signal and Power Integrity,2018

4. A 1.1-V 10-nm Class 6.4-Gb/s/Pin 16-Gb DDR5 SDRAM With a Phase Rotator-ILO DLL, High-Speed SerDes, and DFE/FFE Equalization Scheme for Rx/Tx

5. Maximizing DDR5 Eye-Opening by Identifying Buffer Settings Using Optimization Algorithms;bhagwath;DesignCon,2020

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An Energy Efficient DDR5 I/O Performance Boost in Clamshell Configuration by Charge Pumping From Non-Target Device;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28

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