Efficient power Schottky rectifiers of 4H-SiC
Author:
Publisher
Inst. Electr. Eng. Japan
Link
http://xplorestaging.ieee.org/ielx3/3944/11420/00515017.pdf?arnumber=515017
Cited by 33 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Effect of the contact area on the electrical characteristics of the Ti/6H–SiC (n) Schottky diode;Micro and Nanostructures;2023-01
2. A method for characterizing near-interface traps in SiC metal–oxide–semiconductor capacitors from conductance–temperature spectroscopy measurements;Journal of Applied Physics;2021-02-07
3. 2.3-kV, 5-A 4H-SiC Ti and Ni JBS Rectifiers manufactured in Commercial Foundry: Impact of Implant Lateral Straggle;2020 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia);2020-09-23
4. Near-Interface Trap Model for the Low Temperature Conductance Signal in SiC MOS Capacitors With Nitrided Gate Oxides;IEEE Transactions on Electron Devices;2020-09
5. Fundamental research on semiconductor SiC and its applications to power electronics;Proceedings of the Japan Academy, Series B;2020-07-31
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