Near Field Scanning-Based EMI Radiation Root Cause Analysis in an SSD
Author:
Affiliation:
1. Missouri University of Science and Technology,EMC Laboratory,Rolla,MO,USA
2. Solution Design & Integration Group, SK Hynix Inc,Seongnam,Gyeonggi-do,South Korea
Funder
SK Hynix
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10241361/10241364/10241665.pdf?arnumber=10241665
Reference17 articles.
1. An Effective Method of Probe Calibration in Phase-Resolved Near-Field Scanning for EMI Application
2. Near-Field Scan of Multiple Noncorrelated Sources Using Blind Source Separation
3. EMI prediction in switched power supplies by full-wave and non-linear circuit co-simulation
4. DC-DC Buck Converter EMI Reduction Using PCB Layout Modification
5. A Method to Extract Physical Dipoles for Radiating Source Characterization and Near Field Coupling Estimation
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