A stochastic wire-length distribution for gigascale integration (GSI). I. Derivation and validation-Reference-Cited by-同舟云学术

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A stochastic wire-length distribution for gigascale integration (GSI). I. Derivation and validation

Published:1998-03 Issue:3 Volume:45 Page:580-589
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Davis J.A.,De V.K.,Meindl J.D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx3/16/14384/00661219.pdf?arnumber=661219

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