Dual-Stage Super-Resolution for Edge Devices-Reference-Cited by-同舟云学术

Dual-Stage Super-Resolution for Edge Devices

Published:2023 Issue: Volume:11 Page:123798-123806
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Park Saem¹^ORCID,Choi Geunjae¹^ORCID,Park Seonguk¹^ORCID,Kwak Nojun¹^ORCID

Affiliation:

1. Graduate School of Convergence Science and Technology, Seoul National University, Gwanak-gu, Seoul, Republic of Korea

Funder

National Research Foundation of Korea (NRF) through Korean Government

Institute of Information and Communications Technology Planning and Evaluation (IITP) through Korean Government

LG Electronics

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/6287639/10005208/10271298.pdf?arnumber=10271298

Reference31 articles.

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2. Blind super-resolution kernel estimation using an internal-gan;bell-kligler;Proc 33rd Int Conf Neural Inf Process Syst Adv Neural Inf Process Syst (NIPS),2019

3. Fast and Robust Multiframe Super Resolution

4. ESRGAN: Enhanced super-resolution generative adversarial networks;wang;Proc Eur Conf Comput Vis (ECCV) Workshops,2018

5. Image Quality Assessment: From Error Visibility to Structural Similarity

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