A Novel Process to Setup Electronic Products Test Sites Based on Figure of Merit and Machine Learning-Reference-Cited by-同舟云学术

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A Novel Process to Setup Electronic Products Test Sites Based on Figure of Merit and Machine Learning

Published:2021 Issue: Volume:9 Page:80582-80602
ISSN:2169-3536
Container-title:IEEE Access
language:
Short-container-title:IEEE Access

Author:

Siddiqui Atif^ORCID,Zia Muhammad Yousuf Irfan^ORCID,Otero Pablo^ORCID

Funder

Institute of Oceanic Engineering Research, University of Malaga, Malaga, Spain

“Campus de Excelencia Internacional AndaluciaTech,” University of Malaga, Malaga, Spain

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science

Link

http://xplorestaging.ieee.org/ielx7/6287639/9312710/09443195.pdf?arnumber=9443195

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3. A Machine Learning Based Full Duplex System Supporting Multiple Sign Languages for the Deaf and Mute;Applied Sciences;2023-02-28

4. A Survey on the CEM Life Cycle and their Test Sites Limitations & Constraints;2023 Global Conference on Wireless and Optical Technologies (GCWOT);2023-01-24

5. A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning;Sensors;2023-01-08

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