Introducing Chlorine Into Epoxy Resin to Modulate Charge Trap Depth in the Material
Author:
Affiliation:
1. Department of Electrical Engineering, Hefei University of Technology, Hefei, Anhui, China
2. Laboratoire Plasma et Conversion d'Energie (LAPLACE), University of Toulouse, Toulouse, France
Funder
Science and Technology Project of State Grid Corporation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx7/94/9903995/09832000.pdf?arnumber=9832000
Reference19 articles.
1. Surface charge decay of epoxy resin treated by AP-DBD deposition and direct fluorination
2. Grafting of Antioxidant onto Polyethylene to Improve DC Dielectric and Thermal Aging Properties
3. High Temperature Insulation Materials for DC Cable Insulation — Part I: Space Charge and Conduction
4. A New Approach for Optimizing a Bipolar Charge Transport Model for Dielectric Materials: Theoretical Framework
5. Effects of Hindered Phenolic Antioxidants on Space Charge and Breakdown Properties of Polypropylene
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1. Terminal Chlorine Affected the Short-Term Electrical Properties of Epoxy Resin Materials;IEEE Transactions on Dielectrics and Electrical Insulation;2024-08
2. Development of epoxy resin with superior breakdown strength: A Review;iEnergy;2024-06
3. Study on the Aging Behavior of Epoxy Resin and the Influence of Hydrolyzable Chlorine;Lecture Notes in Electrical Engineering;2024
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