Author:
Butler K.M.,Saxena J.,Jain A.,Fryars T.,Lewis J.,Hetherington G.
Cited by
26 articles.
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1. Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling;2023 IEEE 16th International Symposium on Embedded Multicore/Many-core Systems-on-Chip (MCSoC);2023-12-18
2. High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns;2023 IEEE International Test Conference (ITC);2023-10-07
3. On Reducing Power during Test Process of FPGAs;2022 10th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO);2022-10-13
4. Comprehensive Power-Aware ATPG Methodology for Complex Low-Power Designs;2022 IEEE International Test Conference (ITC);2022-09
5. A variable-length compatible compression scheme based on tristate signals;The Journal of Supercomputing;2019-11-14