Funder
Polish Ministry of Science and Higher Education
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computer Science Applications,Human-Computer Interaction,Information Systems,Computer Science (miscellaneous)
Cited by
1 articles.
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1. Near-Threshold-at-Gate based Test for Stuck-on Fault in Scan-chain Testing;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06