A Self-Calibrated On-Chip Phase-Noise Measurement Circuit With $-$75 dBc Single-Tone Sensitivity at 100 kHz Offset-Reference-Cited by-同舟云学术

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A Self-Calibrated On-Chip Phase-Noise Measurement Circuit With $-$75 dBc Single-Tone Sensitivity at 100 kHz Offset

Published:2007-12 Issue:12 Volume:42 Page:2758-2765
ISSN:0018-9200
Container-title:IEEE Journal of Solid-State Circuits
language:
Short-container-title:IEEE J. Solid-State Circuits

Author:

Khalil Waleed,Bakkaloglu Bertan,Kiaei Sayfe

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/4/4381435/04381451.pdf?arnumber=4381451

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantization-Robust On-Chip Jitter Measurement Technique for Multiple Local Oscillator Systems;2024 IEEE International Symposium on Circuits and Systems (ISCAS);2024-05-19

2. Multi-tier dynamic sampling weak RF signal estimation theory;EURASIP Journal on Advances in Signal Processing;2024-01-06

3. On-Chip Quantization- and Correlation-Robust Jitter Measurement for Low Phase Noise and High Frequency Oscillators;IEEE Transactions on Circuits and Systems II: Express Briefs;2023-11

4. A Reference-Free Phase Noise Measurement Circuit Achieving 24.2-fs Periodic Jitter Sensitivity and 275-fsrms Resolution With Background Self-Calibration;IEEE Journal of Solid-State Circuits;2023-04

5. Analog Spiking Neural Network Based Phase Detector;IEEE Transactions on Circuits and Systems I: Regular Papers;2022-12

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