Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS

Published:2012-09 Issue: Volume: Page:
ISSN:
Container-title:2012 Proceedings of the ESSCIRC (ESSCIRC)
language:
Short-container-title:

Author:

Maes Roel,Rozic Vladimir,Verbauwhede Ingrid,Koeberl Patrick,van der Sluis Erik,van der Leest Vincent

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6331297/6341242/06341361.pdf?arnumber=6341361

Cited by 71 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Novel Device Fingerprinting Sensor Leveraging Back-End-of-Line Resistance and Capacitance;2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME);2024-06-09

2. A Design of 2-Stage Voltage Ramp-Up SRAM Physical Unclonable Function;Chinese Journal of Electronics;2024-03

3. Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging;AEU - International Journal of Electronics and Communications;2024-03

4. Using Gate Tunneling in Bulk CMOS to Create a PUF;IEEE Internet of Things Journal;2024-01-15

5. Studying the Effects of Prolonged Thermal Stress Aiming to Induce Artificial Aging on DRAM Retention-Based Physical Unclonable Functions;2024 IEEE International Conference on Consumer Electronics (ICCE);2024-01-06

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP