A 32KB 18ns random access time embedded PCM with enhanced program throughput for automotive and smart power applications
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/8061155/8094509/08094590.pdf?arnumber=8094590
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. An Extended Temperature Range ePCM Memory in 90-nm BCD for Smart Power Applications;ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC);2022-09-19
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3. Modification of Ge-rich GeSbTe surface during the patterning process of phase-change memories;Microelectronic Engineering;2020-01
4. Design and Analysis of an Ultra-Dense, Low-Leakage, and Fast FeFET-Based Random Access Memory Array;IEEE Journal on Exploratory Solid-State Computational Devices and Circuits;2019-12
5. Drift induced rigid current shift in Ge-Rich GST Phase Change Memories in Low Resistance State;2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS);2019-11
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