Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
22 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. SimPoint-Based Microarchitectural Hotspot & Energy-Efficiency Analysis of RISC-V OoO CPUs;2024 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS);2024-05-05
2. Low Power LDPC Decoding by Reliable Voltage Down-Scaling;2023 IEEE Nordic Circuits and Systems Conference (NorCAS);2023-10-31
3. Impact of Voltage Scaling on Soft Errors Susceptibility of Multicore Server CPUs;56th Annual IEEE/ACM International Symposium on Microarchitecture;2023-10-28
4. Estimating the Failures and Silent Errors Rates of CPUs Across ISAs and Microarchitectures;2023 IEEE International Test Conference (ITC);2023-10-07
5. Silent Data Corruptions: The Stealthy Saboteurs of Digital Integrity;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03