Author:
Park Jung-Hwan,Manoharan Mohana Sundar,Lee Chun-gu,Tawfik Mohamed Atef,Kim Kyoung-Tak,Ahmed Ashraf,Park Joung-Hu
Funder
National Research Foundation of Korea
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Cited by
2 articles.
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