Machine-learning Assisted Dual-Primer High-Resolution Melt for Bacterial and Fungal Infections Detection-Reference-Cited by-同舟云学术

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Machine-learning Assisted Dual-Primer High-Resolution Melt for Bacterial and Fungal Infections Detection

Published:2024-05-02 Issue: Volume: Page:1-4
ISSN:
Container-title:2024 IEEE 19th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
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Author:

Lee Pei-Wei¹,Totten Marissa²,Traylor Amelia¹,Zhang Sean X.²,Hsieh Kuangwen¹,Wang Tza-Huei³

Affiliation:

1. Johns Hopkins University,Department of Machenical Engineering,Baltimore,USA

2. Johns Hopkins School of Medicine,Department of Pathology,Baltimore,USA

3. Johns Hopkins University,Department of Mechanical Engineering and Department of Biomedical Engineering,Baltimore,USA

Funder

National Institutes of Health

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx8/10639541/10639542/10639885.pdf?arnumber=10639885

Reference11 articles.

1. Economic Burden of Fungal Diseases in the United States

2. WHO fungal priority pathogens list to guide research, development and public health action,2022

3. Fungal-Bacterial Interactions in Health and Disease

4. A ‘culture’ shift: Application of molecular techniques for diagnosing polymicrobial infections

5. Integrated Bacterial Identification and Antimicrobial Susceptibility Testing Using PCR and High-Resolution Melt

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