Environmental-Variation-Tolerant Magnetic Tunnel Junction-Based Physical Unclonable Function Cell With Auto Write-Back Technique
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computer Networks and Communications,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx7/10206/9151439/09385126.pdf?arnumber=9385126
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