The "unknown thru" calibration advantage
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/9529/30199/01387858.pdf?arnumber=1387858
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Self-Calibration of Leaky VNA System for In-Fixture Measurements;IEEE Transactions on Microwave Theory and Techniques;2023-11
2. Nano Versus Commercial [Educator’s Corner];IEEE Microwave Magazine;2023-04
3. Calibrated Two-Port Microwave Measurement up to 26.5 GHz for Wide Temperature Range From 4 to 300 K;IEEE Transactions on Instrumentation and Measurement;2023
4. Free-Space Unknown Thru Measurement Using Planar Offset Short for Material Characterization;Journal of Electromagnetic Engineering and Science;2022-09-30
5. Sensitivity Analysis of S-Parameter Measurements Due to Nonideal SOLR Calibration Standards;IEEE Transactions on Instrumentation and Measurement;2021
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