Load-pull + NVNA = enhanced X-parameters for PA designs with high mismatch and technology-independent large-signal device models

Author:

Simpson Gary,Horn Jason,Gunyan Daniel,Root David E.

Publisher

IEEE

Cited by 22 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. DC‐bias and temperature included CSWPL model for RF power transistors;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2024-03

2. Review of RF Device Behavior Model: Measurement Techniques, Applications, and Challenges;Micromachines;2023-12-25

3. Cardiff Behavioral Model from Passive Load-Pull while Enforcing S-Parameters;2023 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC);2023-11-08

4. A Novel Tempreature-Included CSWPL Model for GaN HEMTs;2023 5th International Conference on Circuits and Systems (ICCS);2023-10-27

5. An Overview of Nonlinear Behavioral Modeling Approaches for Microwave GaN Power Transistors;2023 16th International Conference on Advanced Technologies, Systems and Services in Telecommunications (TELSIKS);2023-10-25

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