Author:
Borrego M.,Aning A.,Kampe J.,Lo J.,Alley M.,Walker T.,Griffin Jr.,Magliaro S.,Lohani V.K.,Terpenny J.,Downey G.,Paretti M.,Gofi R.,Sanders M.
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1 articles.
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1. Improved Flying Probe-Inspired In-Circuit Tester for Practical Laboratory Activities;2023 IEEE 29th International Symposium for Design and Technology in Electronic Packaging (SIITME);2023-10-18