Improved YOLOv7 Model for Insulator Surface Defect Detection-Reference-Cited by-同舟云学术

Improved YOLOv7 Model for Insulator Surface Defect Detection

Published:2022-12-16 Issue: Volume: Page:
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Container-title:2022 IEEE 5th Advanced Information Management, Communicates, Electronic and Automation Control Conference (IMCEC)
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Author:

Hong Xiaoxuan¹,Wang Fei²,Ma Jie¹

Affiliation:

1. China-EU Institute for Clean and Renewable Energy, HUST,Wuhan,China

2. China Ship Scientific Research Center,Wuxi,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10019340/10019341/10019873.pdf?arnumber=10019873

Reference25 articles.

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2. Sigmoid-weighted linear units for neural network function approximation in reinforcement learning

3. Rectifier nonlinearities improve neural network acoustic models;maas;Proc ICML,0

4. An Improved CenterNet Model for Insulator Defect Detection Using Aerial Imagery

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