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Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits

  • Published:2014-03 Issue:3 Volume:61 Page:666-673
  • ISSN:0018-9383
  • Container-title:IEEE Transactions on Electron Devices
  • language:
  • Short-container-title:IEEE Trans. Electron Devices

Author:

Weckx Pieter,Kaczer Ben,Toledano-Luque Maria,Raghavan Praveen,Franco Jacopo,Roussel Philippe J.,Groeseneken Guido,Catthoor Francky

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

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