Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Computational Theory and Mathematics,Hardware and Architecture,Theoretical Computer Science,Software
Cited by
123 articles.
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1. Test und Testbarkeit integrierter Schaltungen;Zuverlässige Bauelemente für elektronische Systeme;2020
2. Analysis of Critical and Redundant Vertices in Controlling Directed Complex Networks Using Feedback Vertex Sets;Journal of Computational Biology;2018-10
3. X-Sources Analysis for Improving the Test Quality;2018 IEEE International Test Conference in Asia (ITC-Asia);2018-08
4. A High Performance Scan Flip-Flop Design for Serial and Mixed Mode Scan Test;IEEE Transactions on Device and Materials Reliability;2018-06
5. Trimodal Scan-Based Test Paradigm;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2017-03