Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes-Reference-Cited by-同舟云学术

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Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes

Published:2010-04 Issue: Volume: Page:
ISSN:
Container-title:13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
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Author:

Wu F.,Dilillo L.,Bosio A.,Girard P.,Pravossoudovitch S.,Virazel A.,Ma J.,Zhao W.,Tehranipoor M.,Wen X.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5484099/5491740/05491748.pdf?arnumber=5491748

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Model-Based Edge Clustering;Journal of Computational and Graphical Statistics;2020-10-14

2. A Critical Engineering Dissection of LOS and LOC At-speed Test Approaches;2020 IEEE International Test Conference India;2020-07

3. Integrating overlapping community discovery and role analysis: Bayesian probabilistic generative modeling and mean-field variational inference;Engineering Applications of Artificial Intelligence;2020-03

4. An Inter-Test Cube Bit Stream Connectivity-Optimized X-Filling Approach Aiming Shift Power Reduction;Advances in Intelligent Systems and Computing;2017-12-28

5. Rewind-Support for Peak Capture Power Reduction in Launch-Off-Shift Testing;2011 Asian Test Symposium;2011-11

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