Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits
Author:
Funder
DARPA ERI 3DSOC Program
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Link
http://xplorestaging.ieee.org/ielx7/92/9336749/09316977.pdf?arnumber=9316977
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