Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
5 articles.
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1. Longest Path Selection Based on Path Identifiers;IEEE Access;2024
2. Path Unselection for Path Delay Fault Test Generation;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-02
3. Selecting Path Delay Faults Through the Largest Subcircuits of Uncovered Lines;2022 IEEE 31st Asian Test Symposium (ATS);2022-11
4. Selecting Close-to-Functional Path Delay Faults for Test Generation;2020 IEEE International Test Conference (ITC);2020-11-01
5. LFSR-Based Test Generation for Path Delay Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2019-02