A Variation-Aware MTJ Store Energy Estimation Model for Edge Devices With Verify-and-Retryable Nonvolatile Flip-Flops-Reference-Cited by-同舟云学术

A Variation-Aware MTJ Store Energy Estimation Model for Edge Devices With Verify-and-Retryable Nonvolatile Flip-Flops

Published:2023-04 Issue:4 Volume:31 Page:532-542
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Kamei Aika¹^ORCID,Amano Hideharu¹,Kojima Takuya²,Yokoyama Daiki³,Usami Kimiyoshi³^ORCID,Hiraga Keizo⁴,Suzuki Kenta⁴,Bessho Kazuhiro⁴

Affiliation:

1. Department of Information and Computer Science, Keio University, Yokohama, Japan

2. Graduate School of Information Science and Technology, The University of Tokyo, Tokyo, Japan

3. Department of Computer Science and Engineering, Shibaura Institute of Technology, Tokyo, Japan

4. Sony Semiconductor Solutions Corporation, Atsugi, Japan

Funder

JST, CREST

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

Reference33 articles.

4. Kilocore: Scalable, high performance and power efficient coarse grained reconfigurable fabrics;levine;Proc Int Symp Adv Reconfigurable Syst,2005

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