Physics-Based Models for EM and SM Simulation in Three-Dimensional IC Structures
Author:
Affiliation:
1. Mentor Graphics Corporation, Fremont, CA, USA
2. Mentor Graphics Corporation, Yerevan, Armenia
3. Fraunhofer Institute for Nondestructive Testing (IZFP), Dresden, Germany
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx5/7298/6210435/06168245.pdf?arnumber=6168245
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