Effect of diffusion barrier in the thermally annealed exchange-biased IrMn-CoFe electrode in magnetic tunnel junctions-Reference-Cited by-同舟云学术

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Effect of diffusion barrier in the thermally annealed exchange-biased IrMn-CoFe electrode in magnetic tunnel junctions

Published:2002-09 Issue:5 Volume:38 Page:2715-2717
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:en
Short-container-title:IEEE Trans. Magn.

Author:

Chung-sik Yoo ,Jeong H.D.,Lee J.H.,Yoon C.S.,Kim C.K.,Yuh J.H.,Ando Y.,Kubota H.,Miyazaki T.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/20/22340/01042329.pdf?arnumber=1042329

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of thermally induced structural and compositional transformations on magnetic properties in FeMn/(Fe, Co, Ni, Fe20Ni80, Fe11Ni89, Co30Ni70) films;Thin Solid Films;2023-01

2. Composition dependence of exchange anisotropy in Pt x Mn1−x /Co70Fe30 films;Japanese Journal of Applied Physics;2019-03-19

3. Enhancement of tunneling magnetoresistance by inserting a diffusion barrier in L10-FePd perpendicular magnetic tunnel junctions;Applied Physics Letters;2018-04-09

4. Control of the setting process in CoFe/IrMn exchange bias systems;Journal of Applied Physics;2008-08

5. Annealing effect on thermal stability and microstructure in bilayers;Journal of Magnetism and Magnetic Materials;2007-03

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