1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
2. A scalable solution to AlphaZero based Redundancy Analysis for semiconductor chips;2022 21st IEEE International Conference on Machine Learning and Applications (ICMLA);2022-12
3. A Deep Learning Model for Redundancy Analysis Algorithm Recommendation;2021 IEEE 18th India Council International Conference (INDICON);2021-12-19
4. Redundancy Analysis using Genetic Algorithm;2021 IEEE 18th India Council International Conference (INDICON);2021-12-19
5. AlphaRA: An AlphaZero based approach to Redundancy Analysis;2021 20th IEEE International Conference on Machine Learning and Applications (ICMLA);2021-12