An In-depth and Black-box Characterization of the Effects of Clock Glitches on 8-bit MCUs-Reference-Cited by-同舟云学术

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An In-depth and Black-box Characterization of the Effects of Clock Glitches on 8-bit MCUs

Published:2011-09 Issue: Volume: Page:
ISSN:
Container-title:2011 Workshop on Fault Diagnosis and Tolerance in Cryptography
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Author:

Balasch Josep,Gierlichs Benedikt,Verbauwhede Ingrid

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6075045/6076451/06076473.pdf?arnumber=6076473

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