CNN based Design Rule Checker for VLSI Layouts

Author:

Saraogi Eshan1,Singh Chouhan Giriraj1,Panchal Dipesh1,Patel Manish I.1,Gajjar Ruchi1

Affiliation:

1. Institute of Technology Nirma University,Department of Electronics and Communication Engineering,Ahmedabad,India

Publisher

IEEE

Reference10 articles.

1. In Proceedings of the 56th Annual Design Automation Conference 2019 (Las Vegas, NV, USA) (DAC ’19),0

2. Multilayer CMP hotspot modeling through deep learning

3. Accurate lithography hotspot detection using deep convolutional neural networks

4. Routability-Driven Macro Placement with Embedded CNN-Based Prediction Model

5. DRC+: a pattern-based approach to physical verification;capodieci;Tech Design Forum,2011

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