Author:
Sullivan P.,Tsiamis A.,Ronde M.,Walton A.J.,Smith S.,Terry J.G.
Cited by
2 articles.
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1. Application of Greek cross structures for process development of electrochemical sensors;2023 35th International Conference on Microelectronic Test Structure (ICMTS);2023-03-27
2. Test Structures for Characterising the Fabrication of Miniature Reference Electrodes;2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS);2022-03-21