TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation-Reference-Cited by-同舟云学术

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TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in Propagation-Delay Degradation

Published:2011-08 Issue:4 Volume:58 Page:1927-1934
ISSN:0018-9499
Container-title:IEEE Transactions on Nuclear Science
language:
Short-container-title:IEEE Trans. Nucl. Sci.

Author:

Kastensmidt Fernanda Lima,Fonseca Evaldo Carlos Pereira,Vaz Rafael Galhardo,Goncalez Odair Lelis,Chipana Raul,Wirth Gilson Inácio

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Link

http://xplorestaging.ieee.org/ielx5/23/5985593/05752883.pdf?arnumber=5752883

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Review of TID Effects Reported in ProASIC3 and ProASIC3L FPGAs for 3D PLUS Camera Heads;2023 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2023 NSREC);2023-07

2. FPGA Qualification and Failure Rate Estimation Methodology for LHC Environments Using Benchmarks Test Circuits;IEEE Transactions on Nuclear Science;2022-07

3. FPGA Benchmarking Structures Dedicated to TID Parametric Degradation Evaluation;IEEE Transactions on Nuclear Science;2022-07

4. SET characterization of 130 nm flash-based FPGA device;Microelectronics Reliability;2021-12

5. A Comprehensive Comparison Between Design for Testability Techniques for Total Dose Testing of Flash-Based FPGAs;IEEE Transactions on Nuclear Science;2021-08

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