Innovative high-density ESD protection device in state of the art UTBB FDSOI technologies-Reference-Cited by-同舟云学术

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Innovative high-density ESD protection device in state of the art UTBB FDSOI technologies

Published:2015-09 Issue: Volume: Page:
ISSN:
Container-title:2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
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Author:

Fonteneau Pascal,Solaro Yohann,Marin-Cudraz David,Legrand Charles-Alexandre,Fenouillet-Beranger Claire

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7302375/7314734/07314808.pdf?arnumber=7314808

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Novel gate-grounded NMOS Triggered Device Structures for FD-SOI ESD Protection;2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC);2019-06

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