Fully-Digital Randomization Based Side-Channel Security—Toward Ultra-Low Cost-per-Security-Reference-Cited by-同舟云学术

Fully-Digital Randomization Based Side-Channel Security—Toward Ultra-Low Cost-per-Security

Author:

Breuer Rinat¹,Standaert Francois-Xavier²^ORCID,Levi Itamar¹^ORCID

Affiliation:

1. Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel

2. ICTEAM/ELEN/Crypto Group, Université Catholique de Louvain, Ottignies-Louvain-la-Neuve, Belgium

Funder

Belgian Fund for Scientific Research [FNRS-Fonds de la Recherche Scientifique (F.R.S)]

European Union through the European Research Council (ERC) Project SWORD

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Engineering,General Materials Science,General Computer Science,Electrical and Electronic Engineering

Link

Reference37 articles.

1. How (not) to use Welch’s T-test in side-channel security evaluations;standaert;Proc Int Conf Smart Card Res Adv Appl,2018

2. A testing methodology for side-channel resistance validation;goodwill;Proc NIST Non-Invasive Attack Test Workshop,2011

3. Leakage bounds for Gaussian side channels;unterluggauer;Proc Int Conf Smart Card Res Adv Appl,2017

4. Quantifying the quality of side channel acquisitions;guilley;Proc COSADE,2011

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