On-Wafer High-Frequency Measurement of Mach–Zehnder Modulation Chips Based on Fiber-Free Coupling and Low-Frequency Photodetection-Reference-Cited by-同舟云学术

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On-Wafer High-Frequency Measurement of Mach–Zehnder Modulation Chips Based on Fiber-Free Coupling and Low-Frequency Photodetection

Published:2024 Issue: Volume: Page:1-7
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Zhu Junfeng¹^ORCID,Zou Xinhai¹^ORCID,Jing Chao¹,Xu Ying¹^ORCID,Zhang Yali¹,Zhang Zhiyao¹^ORCID,Liu Yong¹^ORCID,Zhang Shangjian¹^ORCID,Zhu Ninghua²

Affiliation:

1. State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Science and Engineering, Research Center for Microwave Photonics, University of Electronic Science and Technology of China, Chengdu, China

2. Institute of Intelligent Photonics, Nankai University, Tianjin, China

Funder

National Natural Science Foundation of China

Science and Technology Program of Chengdu City

Basic Research Project of Chongqing Science and Technology Commission

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/22/4359079/10600104.pdf?arnumber=10600104

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