Flexible Error Diffusion Algorithm for Binary Defocusing Fringe Projection Profilometry-Reference-Cited by-同舟云学术

Flexible Error Diffusion Algorithm for Binary Defocusing Fringe Projection Profilometry

Published:2023 Issue: Volume:72 Page:1-12
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Xu Chunmei¹^ORCID,Duan Minghui²^ORCID,Sun Zheng²^ORCID,Zheng Yabing²^ORCID,Kan Yan²^ORCID,Jin Yi²^ORCID,Zhu Changan²^ORCID

Affiliation:

1. Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, Hefei, China

2. Department of Precision Machinery and Precision Instruments and the Innovation Laboratory of WuHu State-Owned Factory of Machining, University of Science and Technology of China, Anhui, Hefei, China

Funder

Research on the Major Scientific Instrument of the National Natural Science Foundation of China

Anhui Science and Technology Department

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/10012124/10015838.pdf?arnumber=10015838

Reference36 articles.

1. Three-dimensional shape measurement with binary dithered patterns

2. Multi-objective strategy to optimize dithering technique for high-quality three-dimensional shape measurement*

3. Some recent advances on superfast 3D shape measurement with digital binary defocusing techniques

4. High-quality binary fringe generation via joint optimization on intensity and phase

5. Superfast multifrequency phase-shifting technique with optimal pulse width modulation

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Weakly Supervised Depth Estimation for 3D Imaging with Single Camera Fringe Projection Profilometry;Sensors;2024-03-06

2. Generalized Technique for Separating Nonsinusoidal Errors in Fringe Projection Profilometry With Arbitrary Phase Shifts;IEEE Transactions on Instrumentation and Measurement;2024

3. Defocus-Driven Variable-Shape Fringe for Accuracy Improvement in Fringe Projection Profilometry;IEEE Transactions on Instrumentation and Measurement;2024

4. Error-diffusion-kernel parameters for binary pattern in 1-bit fringe projection profilometry;Applied Optics;2023-11-16

5. Dynamic 3-D Measurement Based on Temporal Fringe Order Recognition;IEEE Transactions on Instrumentation and Measurement;2023