Current mirror test structures for studying adjacent layout effects on systematic transistor mismatch
Author:
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx5/8531/26945/01197465.pdf?arnumber=1197465
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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