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Unveiling the Impact of IR-Drop on Performance Gain in NCFET-Based Processors

  • Published:2019-07 Issue:7 Volume:66 Page:3215-3223
  • ISSN:0018-9383
  • Container-title:IEEE Transactions on Electron Devices
  • language:
  • Short-container-title:IEEE Trans. Electron Devices

Author:

Amrouch HussamORCID,Salamin SamiORCID,Pahwa GirishORCID,Gaidhane Amol D.ORCID,Henkel Jorg,Chauhan Yogesh S.ORCID

Funder

Department of Science and Technology, Science and Engineering Research Board, Government of India and Berkeley Device Modeling Center

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

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2. Frontiers in AI Acceleration: From Approximate Computing to FeFET Monolithic 3D Integration;2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC);2023-10-16

3. Analytical modeling of negative capacitance transistor based ultra low power Schmitt trigger;Solid-State Electronics;2023-09

4. Reliable Brain-inspired AI Accelerators using Classical and Emerging Memories;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

5. Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04
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