Degradation Analysis: Modeling and Evaluating for Electric Energy Meters under Multi-stress-Reference-Cited by-同舟云学术

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Degradation Analysis: Modeling and Evaluating for Electric Energy Meters under Multi-stress

Published:2023 Issue: Volume: Page:1-10
ISSN:1551-3203
Container-title:IEEE Transactions on Industrial Informatics
language:
Short-container-title:IEEE Trans. Ind. Inf.

Author:

Qin Yuhong¹^ORCID,Qiu Wei²^ORCID,Luo Yun¹,Tang Renbo¹,Sun Kaiqi³^ORCID,Yin He⁴^ORCID

Affiliation:

1. PowerChina Zhongnan Engineering Corporation Limited, Changsha, China

2. College of Electrical and Information Engineering, Hunan University, Changsha, China

3. School of Electrical Engineering, Shandong University, Jinan, China

4. Department of Electrical Engineering and Computer Science, University of Tennessee, Knoxville, TN, USA

Funder

China Postdoctoral Science Foundation

National Natural Science Foundation of China

Changsha National Natural Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/9424/4389054/10124718.pdf?arnumber=10124718

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ADG:Research of Anomaly Detection of Energy Gateway Metering Devices based on Autoencoder;2023 2nd Asia Power and Electrical Technology Conference (APET);2023-12-28

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