Defect-Directed Stress Testing Based on Inline Inspection Results-Reference-Cited by-同舟云学术

Defect-Directed Stress Testing Based on Inline Inspection Results

Published:2022-09 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Test Conference (ITC)
language:
Short-container-title:

Author:

He Chen¹,Grosch Paul¹,Anilturk Onder¹,Witowski Joyce¹,Ford Carl¹,Kalyan Rahul¹,Robinson John C.²,Price David W.²,Rathert Jay²,Saville Barry²,Lee Dave²

Affiliation:

1. NXP Semiconductor,Austin,Texas,USA

2. KLA Corporation,Milpitas,California,USA

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983911.pdf?arnumber=9983911

Reference12 articles.

1. Inline Part Average Testing (I-PAT) for automotive die reliability;price;SPIE Advanced Lithography,2020

2. The emergence of inline screening for high volume manufacturing

3. Special requirements for maverick product elimination and outlier management;JEDEC JESD50C,2018

4. Application of Inline Defect Part Average Testing (I-PAT™) to Identify Potential Latent Reliability Defect Escapes: Feasibility Study Results at NXP;anilturk;21st Annual Automotive Electronics Council Reliability Workshop,0

5. Reducing burn-in time through high-voltage stress test and Weibull statistical analysis

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Customizing ATPG User-Defined Stresses and Tests To Target Cell-Neighborhood-Bridging Defects;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

2. Automotive Semiconductor Test: Challenges and Solutions towards Zero Defect Quality;2023 45th Annual EOS/ESD Symposium (EOS/ESD);2023-10-02

3. Test And Reliability Improvement With Defect-Image Classification And Machine-Learning Algorithms In Semiconductor Industry For Automotive Applications;2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24

4. Targeted Custom High-Voltage Stress Patterns on Automotive Designs;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24

5. 38‐4:Invited Paper:Inline Screening Known Good Die (KGD) Mapping for MicroLEDs;SID Symposium Digest of Technical Papers;2022-06