Author:
Yoshimura M.,Hosokawa T.,Ohta M.
Cited by
13 articles.
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1. A Hybrid Test Point Insertion Strategy for Improved Test Metrics;2024 IEEE 8th International Test Conference India (ITC India);2024-07-21
2. X-Tolerant Logic BIST for Automotive Designs using Observation Scan Technology;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
3. A New Framework for RTL Test Points Insertion Facilitating a “Shift-Left DFT” Strategy;2023 IEEE International Test Conference (ITC);2023-10-07
4. LBIST for Automotive ICs with Enhanced Test Generation;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021
5. Test Sequence-Optimized BIST for Automotive Applications;2020 IEEE European Test Symposium (ETS);2020-05