Funder
National Natural Science Foundation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Applied Mathematics,Electrical and Electronic Engineering,Signal Processing
Cited by
12 articles.
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1. ScaleFace: Uncertainty-aware Deep Metric Learning;2023 IEEE 10th International Conference on Data Science and Advanced Analytics (DSAA);2023-10-09
2. Understanding the Feature Norm for Out-of-Distribution Detection;2023 IEEE/CVF International Conference on Computer Vision (ICCV);2023-10-01
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4. The active contours method analysis in solving cephalometry problems;2023 IX International Conference on Information Technology and Nanotechnology (ITNT);2023-04-17
5. Out-of-Distribution (OOD) Detection Based on Deep Learning: A Review;Electronics;2022-10-28