Hot-Carrier-Induced Reliability Concerns for Lateral DMOS Transistors with Split-STI Structures-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Hot-Carrier-Induced Reliability Concerns for Lateral DMOS Transistors with Split-STI Structures

Published:2021-04-08 Issue: Volume: Page:
ISSN:
Container-title:2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
language:
Short-container-title:

Author:

Lu Li,Ye Ran,Liu Siyang,Yin Zhibo,Sang Yuanchang,Sun Weifeng,Su Wei,Lin Feng,Ma Shulang,Liu Yuwei

Funder

Jiangsu Province

Key Research and Development Plan of Jiangsu Province

Southeast University

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9420829/9420830/09420919.pdf?arnumber=9420919

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The Study on the Optimization and Electrical Behavior of NEDMOS Transistors for High-Voltage Power Applications;2023 China Semiconductor Technology International Conference (CSTIC);2023-06-26

2. Hot-Carrier-Induced Reliability for Lateral DMOS Transistors With Split-STI Structures;IEEE Journal of the Electron Devices Society;2021

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP